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4 edition of 2000 22nd International Conference on Microelectronics : proceedings found in the catalog.

2000 22nd International Conference on Microelectronics : proceedings

Niš, Yugoslavia, 14-17 May 2000

by International Conference on Microelectronics (22nd 2000 NiЕЎ, Yugoslavia).

  • 312 Want to read
  • 34 Currently reading

Published by Electron Devices Society of the IEEE in [Piscataway] .
Written in English

    Subjects:
  • Integrated circuits -- Congresses.,
  • Microelectronics -- Congresses.,
  • Printed circuits -- Congresses.

  • Edition Notes

    Other titlesProceedings, MIEL 2000, 22nd International Conference on Microelectronics
    Statementorganized by Yugoslavia IEEE Section, EDS/SSC Chapter ; under technical co-sponsorship of the IEEE Electron Devices Society.
    ContributionsIEEE Electron Devices Society., Yugoslavia IEEE Section. Electron Devices Chapter.
    Classifications
    LC ClassificationsTK7874 .I57 2000
    The Physical Object
    Pagination2 v. :
    ID Numbers
    Open LibraryOL22261844M
    ISBN 100780352351, 078035236X

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2000 22nd International Conference on Microelectronics : proceedings by International Conference on Microelectronics (22nd 2000 NiЕЎ, Yugoslavia). Download PDF EPUB FB2

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Get this from a library. 22nd International Conference on Microelectronics: proceedings: Nis, Yugoslavia, May [Yugoslavia IEEE Section. Electron Devices Chapter.; IEEE Electron Devices Society.; Institute of Electrical and Electronics Engineers.;]. Proceedings, MIEL 22nd International Conference on Microelectronics Microelectronics,proceedings, 22nd International Conference on: Responsibility: organized by Yugoslavia IEEE Section, EDS/SSC Chapter ; under technical co-sponsorship of the IEEE Electron Devices Society.

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Proceedings (Cat. NoTH) Location: Nis, Yugoslavia; 21st International Conference on Microelectronics. Proceedings Location: Nis, Yugoslavia; Proceedings of International Conference on Microelectronics. booktitle = "Proceedings of 22nd international conference on microelectronics", address = "United States", Boselli, G, Mouthaan, AJ & Kuper, FGRise-time effects in ggnMOSt under TLP stress.

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Proceedings (Cat. NoTH) Article #: Date of Conference: May Date Added to IEEE Xplore: 06 August ISBN Information: Print ISBN: INSPEC Accession Number: DOI: /ICMEL.

Conference: Microelectronics, Proceedings. 22nd International Conference on, Volume: 1. this book should be useful to research workers in the MOS field. Because of its careful. This book contains extended and revised versions of the best papers presented at the 22nd IFIP WG /IEEE International Conference on Very Large Scale Integration, VLSI-SoCheld in Playa del C.

ICAS CD-ROM PROCEEDINGS ISBN 0 2 5 22nd INTERNATIONAL CONGRESS OF AERONAUTICAL SCIENCES 27 August - 1 SeptemberHarrogate International Conference Centre, UK INFORMATION FROM ICAS. Presidential Preface to the 22nd Congress; CD Proceedings and Abstract Book Editor, Professor I Grant.

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Nassiopoulou, C. Fotakis 2 Edition of the Proceedings of the 6th International conference on Porous Semiconductor Science and Technology (PSST ). Special Issue of Physica.

Published in: 22nd International Conference on Microelectronics. Proceedings (Cat. NoTH) Article #: Date of Conference: May Date Added to IEEE Xplore: 06 August ISBN Information: Print ISBN: INSPEC Accession Number: DOI: /ICMEL.

Accepted high quality papers will be presented in oral and postersessions, will appear in the Conference Proceedings and will be indexed in PubMed/MEDLINE IEEE 70th Electronic Components and Technology Conference (ECTC) ECTC is the premier international conference sponsored by the IEEE Components, Packaging and Manufacturing Society.

Get this from a library. Proceedings, International Symposium on Microelectronics: September, Hynes Convention Center, Boston, Massachusetts. [John W Roman; International Microelectronics and Packaging Society.; Society of Photo-optical Instrumentation Engineers.;].

Journal description. Microelectronics Reliability is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems.

International Conference on Microelectronic Test Structures The Measurement and Characterisation Conference The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions The.

T3 - 22nd International Conference on Microelectronics, MIEL - Proceedings. SP - EP - BT - 22nd International Conference on Microelectronics, MIEL - Proceedings. PB - IEEE.

T2 - 22nd International Conference on Microelectronics (MIEL ) Y2 - 14 May through 17 May ER. The IAEG holds an international congress every four years, hosted by a country with a national group.

Additionally, an international meeting is organised by the IAEG, in many cases on the occasion of, and in conjunction with, the International Geological Congress (IGC).

National groups are encouraged to organise symposia on specific engineering geological subjects, under. SIGIR Proceedings of the 23rd Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, July, Athens, Greece.

ACM. Microelectronics Proceedings (MIEL), 27th International Conference on Microprocessor Test and Verification (MTV), 10th International Workshop on Microwave and Optoelectronics Conference, Elected full professor in at the Faculty of Electrical Engineering in Niš, in the field of Electronic Components; PhD degree received in at the Faculty of Electrical Engineering in Niš, in the field of Semiconductor Components; Master degree received in at the Faculty of Electrical Engineering in Niš, in the field of Semiconductor Components.John Paparrizos.

Columbia University, New York, NY, USA.